基本信息
姓 名：赵琳
毕业学校：新加坡南洋理工大学
专 业：计算机科学与工程、电气工程
研究方向：图挖掘，机器学习，深度学习，芯片制造产能提升，芯片性能优化
电子邮箱：Linzhao@ njtech.edu.cn
教育经历
2020.01~ 2024.09 新加坡南洋理工大学 计算机科学与工程 博士（导师：Yeo Chai Kiat教授, Arijit Khan 教授）
2015.08 ~ 2017.07 新加坡国立大学 电子工程 硕士
2012.08 ~ 2015.07 新加坡国立大学 电气工程 学士
科研成果
论文成果
[1] Lin Zhao, Sourav Sen Gupta, Arijit Khan, and Robby Luo. 2021. Temporal Analysis of the Entire Ethereum Blockchain Network. In Proceedings of the Web Conference 2021 (WWW ’21). Association for Computing Machinery, New York, NY, USA, 2258-2269. (CCF-A)
[2] Lin Zhao, Chai Kiat Yeo, Arijit Khan, Robby Luo, LingPeng Jin. 2024. Identifying Shader Sub-patterns for GPU Performance Tuning and Architecture Design. Scientific Reports, Volume 14, 24036 (2024). https://doi.org/10.1038/s41598-024-68974-8. (中科院二区，影响因子: 3.8)
[3] Lin Zhao, SH Goh, YH Chan, BL Yeoh, Hao Hu, MH Thor, Alan Tan, Jeffrey Lam. 2019. Optimization of an Artificial Neural Network System for the Prediction of Failure Analysis Success, Microelectronics Reliability, Volume 92, 2019, Pages 136-142, ISSN 0026-2714. （影响因子：1.6）
[4] Lin Zhao, Arijit Khan, Robby Luo and Chai Kiat Yeo. 2022. Graph Mining and Machine Learning for Shader Codes Analysis to Accelerate GPU Tuning. Complex Networks and Their Applications XI: Proceedings of The Eleventh International Conference on Complex Networks and Their Applications: COMPLEX NETWORKS 2022- Volume 1. Cham: Springer International Publishing.
[5] Lin Zhao, Arijit Khan, and Robby Luo. 2022. ShaderNet: graph-based shader code analysis to accelerate GPU’s performance improvement. In Proceedings of the 5th ACM SIGMOD Joint International Workshop on Graph Data Management Experiences & Systems (GRADES) and Network Data Analytics (NDA).
[6] Lin Zhao, Chai Kiat Yeo. 2023. Anomalous Wafer Map Detection and Localization using Unsupervised Learning, In proceedings of 20th International Conference on IC Design and Technology (ICICDT’ 23), Tokyo, Japan, 2023, pp. 80-83, doi: 10.1109/ICICDT59917.2023.10332324。
[7] Lin Zhao, YT Ngow, SH Goh, YH Chan, Hao Hu, F Jeff, CC Tay. 2019. Accurate Memory Bitmapping based on Built-in Self-Test: Challenges and Solutions, 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA), Hangzhou, China, 2019, pp. 1-8, doi: 10.1109/IPFA47161.2019.8984869.
[8] Lin Zhao, SH Goh, YH Chan, BL Yeoh, Hao Hu, MH Thor, Alan Tan, Jeffrey Lam. 2018. Prediction of Electrical and Physical Failure Analysis Success Using Artificial Neural Networks, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, 2018, pp. 1-5. doi: 10.1109/IPFA.2018.8452176.
[9] MH Thor, SH Goh, Lin Zhao, BL Yeoh, YT Ngow, Hu Hao, YH Chan, Jeffrey Lam. 2018. Localization of Embedded Memories using EeLADA, 2018 International Symposium for Testing and Failure Analysis (ISTFA), Proceedings from the 44th International Symposium for Failure Analysis (ISTFA).
[10] BL Yeoh, SH Goh, MH Thor, Hu Hao, Alan Tan, YH Chan, Lin Zhao, SP Neo, Jeffrey Lam, CM Chua, SH Tan. 2018. A Demonstration on the Effectiveness of Wafer-level Thermal Microscopy as A Complementary Tool to Photon Emission Microscopy Using MBIST Failure Debug, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, 2018, pp. 1-5. doi: 10.1109/IPFA.2018.8452602
[11] SH Goh, YT Ngow, B L Yeoh, Edy Susanto, Hu Hao, MH Thor, Lin Zhao, Y. H. Chan, Jeffrey Lam, and Tay Chee Chun. 2018. Faster Localization of Logic Soft Failures Using a Combination of Scan Diagnosis at Reduced VDD and LADA, 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Singapore, 2018, pp. 1-5. doi: 10.1109/IPFA.2018.8452553
[12] SH Goh, EC Manlangit, E Susanto, BL Yeoh, H Hao, A Tan, HH Ma, Lin Zhao, YH Chan, J Lam. 2017. A detailed analysis scheme to interpret multiple photon emissions micrograph for improved diagnostic resolution on open defects, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Chengdu, 2017, pp. 1-6. doi: 10.1109/IPFA.2017.8060217
[13] SH Goh, BL Yeoh, YT Ngow, Hu Hao, Alan Tan, YH Chan, Lin Zhao, Jeffrey Lam, CC Tay. 2017. Characterization of Dynamic Laser Stimulation Approach to Locate Memory Fails Using EeLADA, Proceedings of the ISTFA 2017. ISTFA 2017: Conference Proceedings from the 43nd International Symposium for Testing and Failure Analysis.
[14] BL Yeo, SH Goh, GF You, H Hao, A Tan, YH Chan, Lin Zhao, J Lam. 2017. Fault isolation of digital scan logic without scan diagnosis, 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), Chengdu, 2017, pp. 1-5. doi: 10.1109/IPFA.2017.8060124
[15] M Lee, BL Yeoh, SH Goh, GF You, Alan Tan, Hu Hao, YH Chan, Lin Zhao, Varun Gupta, HHWT Ma, SP Neo, GB Ang, YT Ngow, Jeffrey Lam, CC Tay. 2016. Characterization of Dynamic Laser Stimulation Approach to Locate Memory Fails Using EeLADA, Proceedings of the ISTFA 2016. ISTFA 2016: Conference Proceedings from the 42nd International Symposium for Testing and Failure Analysis. Fort Worth, Texas, USA. (pp. pp. 540-546).
授权专利
发明专利2项：
[1] SH Goh, YH Chan, BL Yeoh, Jeffrey Lam, Lin Zhao. 2018. Defeat Isolation Methods and Systems. US 9958502 B2. Filed Feb. 17, 2016, Issued May 1, 2018
[2] SH Goh, YH Chan, BL Yeoh, Lin Zhao, MH Thor. 2023. Defect localization in embedded memory US11639959 B2. Filed Feb. 18, 2021, Issued May 2, 2023
工作经历
AMD半导体（新加坡）有限公司
高级产品工程师 2019.12-至今
格罗方德半导体（新加坡）科技有限公司 （Globalfoundries）
测试诊断工程师 2015.05-2019.11
英飞凌科技（新加坡）有限公司 （Infineon Technologies）
硬件测试实习生 2014.05-2014.08
